Abstract

Modulated structure in organometallic vapour phase epitaxially grown InPSb(001) layers has been investigated using transmission electron microscopy (TEM) and transmission electron diffraction (TED). TEM results show that a fine scale modulated contrast (15–20 nm) and a fine scale speckled contrast (∼5 nm) are simultaneously present. In addition, a fine needle-like contrast (∼1.5–2.1 nm) is present. TED patterns show that (111) and (111) CuPt-type ordered variants are present. Diffuse streaks along the [110] direction are also observed in the [110] TED pattern and found to be associated with the needle-like contrast. A possible model involving segregation of atoms associated with rows of missing dimers in the surface reconstruction or the presence of antiphase boundaries (APBs) and domain boundaries in CuPt-type ordered regions present in the layers is suggested to explain the origin of the needle-like contrast.

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