Abstract
Dynamic faults detection is important in recent Random Access Memory (RAM) technologies. However, there is less research performed to design memory test algorithms for dynamic faults detection. Industry prefers the March test algorithm due to its simplicity and good fault coverage. Implementation of a single March test algorithm to cover all fault models is not suitable in the industry due to high test complexity leads to expensive test costs. Therefore, in this research, a new optimization method is introduced to enhance the dynamic fault detection of the existing March test algorithm. The optimization process is achieved by implementing a set of optimization rules to the original March algorithm while preserving the original test complexity. By using the proposed optimization rules, the modified March MSS algorithm has a 40% improvement in dynamic fault coverage from the original March MSS algorithm.
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