Abstract
The main application of Monte Carlo methods in raytracing software lies in the field of scattering analysis. The basis for this simulation in raytracing software is the variation of the ray direction after refraction described by a Bidirectional Scattering Distribution Function (BSDF). In the simpliest case the scattering process is described by a BSDF which only depends on the scattering angle. We have extended this simple approach in different directions. One extension enables the simulation of different surface scattering effects. For example with a BSDF, which varies with the ray height on the surface, the local variation of the surface roughness due to fabrication effects can be simulated. Another extension allows the simulation of volume scattering. In this case the scattering properties of the material can be described by two functions: As before a scattering function determines the change in the ray direction due to local defects in the material. Additionally a function for the free path length is used e.g. to describe the density of local defects in the volume. The requirements and the limitations of the methods are shown and discussed. Several examples of typical applications are presented.
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