Abstract
AbstractMaximum corn grain yield increase associated with post‐planting cultivation of weed‐free corn on a soil susceptible to crusting was 1,790 kg/ha or 25% of mean yield. The maximum contribution of increased water infiltration was 770 kg/ha. The remaining causes of yield increase associated with stirring the soil surface were not unequivocably established. Oxygen diffusion rates at 10‐cm depth were essentially unaffected by cultivation. Cultivation reduced short term evaporation from the soil surface 30 to 45% and resulted in a twofold to sixfold increase in root weights between corn rows to a depth of 23 cm.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
