Abstract
An accurate reflectometer has been set up on the 2.2 m monochromator at the NBS SURF-II synchrotron radiation facility to determine optical constants of materials from 50–150 eV. Properties of the monochromator, reflectometer and NBS windowless photodiode detector are discussed. Reflectivity data from 7–30 nm for two low expansion materials, a recrystallized glass (A) and a high silica glass (B), are reported and preliminary optical constants for one glass are presented.
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