Abstract
In this paper, we present a modification of Endres's method for minimizing AFI for Continuous Sampling Plan CSP-2 plan under inspection error. The measure of average outgoing quality (AOQ) under both perfect and imperfect replacemant conditions are considered. Both CSP-1 plan and CSP-2 plan under inspection error have the same minimum AFI when the specified process average fraction detective, p , is larger than the average outgoing quality limit, AOQL. Under the same sampling cost, one can use the proposed model to minimize AFI of CSP-I plan under inspection error to replace that of CSP-2 plan under inspection error, because CSP-I plan is more convenient to execut than CSP-2 plan.
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