Abstract
In this paper it is reported a special technological solution to improve the performance and to simplify the fabrication process of the miniaturized magnetostrictive delay line (MDL) obtained by thin films technology. In order to increase the sensitivity level without adding new difficulties in the reliability of the sensing element, we conceived and realized a new configuration of miniaturized MDL using a magnetoresistive sensing three-layered structure. According to this configuration, MDL arrangement can be miniaturized, without the use of the receiving coil fabricated by thin film technology and photolithographic techniques, allowing thus a simple fabrication process and a high output signal level.
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