Abstract
The rf and microwave losses of devices based on YBa 2Cu 3O 7−δ superconducting films are dominated by extrinsic mechanisms that can be controlled by a careful device fabrication and design. Often the granular nature of the films shows up in the measurements of the residual surface resistance. We have measured the surface impedance of a large number of highly epitaxial, dc sputtered YBa 2Cu 3O 7−δ films patterned by argon ion milling as meanderline microstrip resonator (T c>90K and ΔT c<1K). The plot of R s vs. H rf shows that the excess surface resistance is determined by Josephson vortices propagating in the grain boundaries, in good agreement with the theoretical prediction of Halbritter. Further, the temperature and frequency dependence of Z s is consistent with this hypothesis.
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