Abstract
The helium retention characteristics and helium bubble distribution in tungsten were studied using 3He(d,p) 4He nuclear reaction analysis (NRA) and transmission electron microscopy (TEM) on two forms of tungsten: single crystal and polycrystalline, implanted to 1 × 10 19 3He/m 2 at 850 °C and annealed at 2000 °C. The NRA results revealed that as-implanted single crystal and polycrystalline tungsten exhibited similar helium retention characteristics. Stepwise annealing reduced the helium retention in both single crystal and polycrystalline tungsten when the number of implantation steps and annealing time were increased. The TEM results indicated that microstructure played a large role in helium trapping; the existence of grain boundaries led to significant cavity formation and greater cavity growth. Single crystal tungsten had less trapping sites for helium, allowing long range He diffusion during annealing. The decrease of He retention in polycrystalline tungsten during stepwise annealing was probably due to significant recrystallization, resulting in decrease of grain boundary density.
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