Abstract
In this research, we attempted to calibrate Young's modulus of lead tungstate (PWO) single crystals by combing the piezo-spectroscopic (PS) method and the indentation technique. A series of Vickers indentation cracks were generated at the corners of the indenter print on the surface of a-plane and c-plane PWO single crystals, respectively. According to microscopic assessments of crack opening displacements (COD) for cracks propagated along different crystallographic directions, we first determined the stress intensity factor associated with the tensile stress field developed ahead of the indentation crack tip. Then, upon clarifying both the PS algorithm for spectral shift analysis and the convolution effect of the laser probe, the related plane Young's modulus could be retrieved from Raman line-scans ahead of the crack tip. Young's modulus values of 70 GPa and 89 GPa were determined for the a-plane and c-plane of PWO single crystal, respectively. The Raman PS technique applied to controlled microscopic stress fields represents a convenient method for assessing the mechanical properties in small portions of materials embedded in devices.
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