Abstract
Methods of construction of the criterial membership function (CMF) in order to provide the resistance of large-scale integrated circuits (IC) to radiative and electromagnetic radiations at the functional-logical description level are described. These functions are based on a model of the Brauer fuzzy digital automation. A principal distinction of this method from conventional ones is the possibility of the account in the explicit form of the dependence of the resistance of functional-logical models of LSICs on the effect type, operational mode, functional state, and circuit solutions. Algorithms and recommendations on the methods of prediction of radiative effects in LSICs caused by electromagnetic, steady-state, and pulsed radiations are given.
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