Abstract
The mechanism of enhanced reflection of terahertz wave via photoexcitation of a poly[2-methoxy-5-(2[Formula: see text]-ethylhexyloxy)-1,4-phenylenevinylene] (MEH-PPV)/poly(3-ethylenedioxythiophene):poly(4-styrene sulfonate) (PEDOT:PSS) hybrid structure on silicon is reported. The reflectivity and incident angles measured for different samples conform to Brewster’s law. When the sample was excited by a continuous wave 450 nm laser at two randomly selected angles, the reflectivity of sample increased. According to the Fresnel equations, this phenomenon is related to the conductivity and refractive index of the sample. In calculated time-domain spectra excited by the laser at various power densities, the enhanced terahertz reflectivity is attributed to conductivity changes rather than the refractive index.
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