Abstract
The diglycidyl ether of bisphenol A/dicyandimide (DGEBA/DICY) films were tested using 160 keV electron irradiation simulation facility. The degradation mechanism of the irradiated DGEBA/DICY was analyzed using EPR, FT-IR, and XPS. The kinetic process of irradiation induced degradation of DGEBA/DICY was expressed quantitatively based on the data from FT-IR and XPS. The relationship between the micro-mechanism and the macro-property was proposed that allowed describing the property variation of DGEBA/DICY with electron irradiation fluence.
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