Abstract
High temperature mechanical behaviors of a thin ceramic substrate of 3%yttria-stabilized zirconia (3YSZ) were characterized using ARAMIS optical measurement system (GOM Optical Measuring Techniques, Braunschweig, Germany). The technique relies on 3D image correlation photogrammetric principles providing non-contact determination of shape, deformation and full-field strain. Experimentally, a random pattern with good contrast was applied to the surface of a thin substrate, and the deformation of substrate under load was recorded and evaluated using digital image processing. The elastic modulus of the ceramic substrate at room temperature and 725°C was indirectly calculated from the deflection data, and generally it was found to be in agreement with values reported elsewhere. This characterization technique also allows the determination of the maximum value of deflection of the substrate at failure during pressure rupture testing and in-situ observation of ceramic membrane response under temperatures.
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