Measuring Frequency Characteristics of Linear Two-Port Networks Automatically

Abstract

This paper presents a new automatic technique for complete linear characterization of transistors and general two-port devices from standard insertion and bridging measurements. This technique includes a calibration sequence and mathematical transformation to provide parameters independent of actual test set impedances, as well as a special hardware design which allows for convenient self-measurement of the test set impedances. Knowledge of these impedances is used to reduce the measured quantities to arbitrary device parameters referenced entirely to a set of calibration standards. This independence of the parameters from the measuring set impedances allows for considerable reduction in the design constraints on the test set impedances and device connecting jigs.