Abstract
In soils with high electrical conductivities, time domain reflectometry (TDR) principles fail to measure the apparent dielectric constant by travel time analysis. This limits the application of water content measurement of existing TDR technologies on those materials. This paper describes a new approach for determining the dielectric constants in highly conductive soils from surface reflections of TDR signals. The multiple reflections at the interfaces of impedance mismatches in the ASTM standard probe were studied. Extension rods were used to avoid the overlap of the reflections along the probe. A relationship between the reflection coefficient at the soil surface and the apparent dielectric constant of the soil was established theoretically and validated by laboratory experiments. Results indicate that the dielectric constant can be determined with reasonable accuracy from the surface reflection coefficient even for soils with high electrical conductivities, where the conventional travel time analysis fails. Compared with alternative approaches, such as based on inversion model, this new method offers high time efficiency in extending TDR applications in highly conductive soils.
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