Abstract
We developed a method for group delay and group delay dispersion measurements, based on location of interference resonance peaks. Such resonance peaks can be observed in transmittance or in reflectance when two mirrors are placed parallel to each other and separated by a thin air spacer. By using a novel approach, based on simultaneous processing of the data acquired for different spacer distances we obtained reliable results with high resolution. Measurements were performed both in transmittance and reflectance layouts depending on the reflectivity of the mirror to be measured. The developed method allows dispersion measurements of ultraviolet mirrors and ultra-broadband mirrors spanning more than one optical octave to be performed.
Highlights
Dispersive mirrors (DM) [1,2,3] are nowadays widely used for precise dispersion control in a broad variety of ultrafast optical devices including femtosecond lasers [3], chirped pulse amplifiers (CPA) [4] and enhancement cavities [5]
We developed a method for group delay and group delay dispersion measurements, based on location of interference resonance peaks
DMs are often used in complementary pair configurations [6,7] and in double-angle schemes [8] in order to achieve the smallest possible residual group delay (GD) and group delay dispersion (GDD) oscillations in a broader spectral range
Summary
Dispersive mirrors (DM) [1,2,3] are nowadays widely used for precise dispersion control in a broad variety of ultrafast optical devices including femtosecond lasers [3], chirped pulse amplifiers (CPA) [4] and enhancement cavities [5]. An additional problem of the original approach described in [30] is connected with the necessity of spacer thickness evaluation It was performed in [30] on the basis of a priori information on the measured mirrors, i.e., by using the wavelengths of transmittance maxima in the region where zero GDD was expected. We propose a more sophisticated approach which provides higher resolution in both frequency and GD domains It is based on a series of measurements of the resonance peak positions for different spacer thicknesses and consequent simultaneous processing of all obtained information. The only essential requirement is the proper parallel alignment of mirrors and its stability during the entire measurement process With this improvement, RSI compares favorably with WLI in terms of simplicity/compactness and provides superior accuracy of the GD/GDD measurements.
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