Abstract
An interferometric approach to the calculation of the two-dimensional MTF of an optical system is proposed. The technique is based on the computation of the second-order spatio-temporal statistics of a fluctuating speckle pattern. The theorem of Van Cittert-Zernike is invoked to relate the speckle, due to the illumination of a perfect diffuser by the point spread function of an optical system, to the two-dimensional MTF of the system. The computed MTF is displayed in the form of a contour map and can also be represented in the conventional form of a one-dimensional vertical cut. Preliminary measurements have yielded qualitatively useful results and clearly illustrate the suitability of two-dimensional maps for the detection of transfer function anisotropies.
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