Abstract
High angle hollow cone darkfield or Z-contrast imaging is used to supress dynamical contributions like bend or extinction contours to electron imaging. Using a multiple scattering model it is possible to interpret image intensities quantitatively and to analyze specimen composition on a nanometer scale without specialized detectors like energy-energy-loss spectroscopy or energy dispersive spectroscopy. This method is practically tested on the interdiffusion of Cu-Au couples. Measured thin film interdiffusion coefficents, are comparable to literature data of the bulk diffusion coefficent in this system.
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