Abstract
X-ray emission band spectra have been measured by an EPMA to utilize their spectral fine features for the characterization of heterogeneous materials. C K-emission band spectra of carbonaceous materials are discussed in relation to the graphitic ordering of crystallite and two dimensional distribution of crystal orientation is demonstrated on the fracture surface of natural graphite. Influence of electron beams on the degradation of high polymers during the spectral measurement has become prominent especially in the case of halogen bearing substances. C K spectra of high polymers and their degradates are shown relating to the measuring conditions. It is also shown that glassy materials with heterogeneous distribution of constituents can be characterized by measuring Mn L- and B K-emission band spectra.
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