Abstract
The application of mass spectrometric methods in the determination of isotopic abundance and of trace elements in highly enriched187Os is described. The capability of ICP-MS in comparison with solid-state mass spectrometric techniques (SIMS, SNMS and GDMS) for the precise isotopic analysis of highly-enriched osmium has been investigated. The formation of cluster ions in several plasma types has been measured, and the problems of possible interferences from molecular and cluster ions is discussed.
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