Abstract
In the main magnetic focus ion source, atomic ions are produced in the local ion trap created by the rippled electron beam in focusing magnetic field. Here we present the novel modification of the room-temperature hand-size device, which allows the extraction of ions in the radial direction perpendicular to the electron beam across the magnetic field. The detected X-ray emission evidences the production of Ir44+ and Ar16+ ions. The ion source can operate as the ion trap for X-ray spectroscopy, as the ion source for the production of highly charged ions and also as the ion source of high brightness.
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Schedule a callMore From: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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