Abstract
This paper describes the dependence of SAW velocity change on bias magnetic field in a delay line consisting of a magnetostrictive Co-Cr film and YZ-LiNbO <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf> substrate. When the hard direction of magnetization was perpendicular to the film plane, the percent velocity change attained was ∼ 310 ppm. On the other hand, when the easy direction was perpendicular to the plane, it was negligibly small. Since the magnetic anisotropy of the Co-Cr films can be changed by adjusting their composition, they may be useful for the perpendicular recording medium as well as the tunable SAW devices.
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