Abstract
Magnetic anisotropy measurements performed in a (110)(Tb0.27Dy0.73)Fe2 (Terfenol-D) film epitaxially grown on a sapphire substrate are presented. The magnetictorque curves have been determined by using a vectorial vibrating sample magnetometer,which allows us to measure the angular dependence of magnetization components parallel,, and perpendicular, , to the applied field up to 2 T. The fourfold symmetry associated with thecubic structure within the (110) plane is clearly observed. The analysis ofthe experimental torque has been carried out considering magnetocrystallineanisotropy up to sixth order and magnetoelastic energy up to second order; so,the magnetocrystalline anisotropy constants in the (110) plane of the film,K1 and K2, have been obtained. This allows us to determine the direction of the magnetization easyaxis for (110) Terfenol-D thin-film: it is at RT, passes through at 140 K and then changes to at 40 K. It was completely impossible to explain the angular dependence of the experimentalmagnetic torque without including shear and tetragonal magnetoelastic stress parameters,b2 and b1, respectively. This confirms the paramount role of the strain in the determination of themagnetic properties in this kind of Terfenol-D thin film.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
