Abstract
A quartz-crystal thickness monitor was successfully applied at low temperatures (5–80 K) and used to determine the areal density of condensed CH4, N2, CO2, Ar, Kr, and Xe. The frequency-shift dependence on the deposited mass was calibrated using the x-ray absorption technique. The stability, reproducibility, and temperature variation of the resonance frequency in the 5–300 K temperature range are discussed.
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