Abstract
Two-dimensional generators proposed to date have been based mainly on linear finite-state machines such as Linear Feedback Shift Registers, cellular automata, and ring generators. These mechanisms are usually accompanied by phase shifters in order to avoid the degradation of the fault coverage caused by correlations/dependences in the produced test bit sequences. Phase shifters insert unavoidable delay and hardware overhead in the resulting structure. In this paper we propose the utilization of accumulators whose inputs are driven by Linear Feedback Shift Registers as a candidate solution to the generation of 2D test patterns. The proposed scheme results in high period of the output sequence, and extremely low hardware overhead.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.