Abstract
This is the first report on the detailed study on low temperature (6–300 K) electrical conductivity and Seebeck coefficient on copper indium oxide polycrystalline thin films deposited on soda lime glass substrates by a reactive evaporation method. These films, characterized using various experimental techniques, show the highest electrical conductivity (20 to 125 S cm−1) reported to date as well as n- and p- type conductivity. The electrical conductivity mechanisms, based on Mott's, Seto's and Arrhenius models, in different temperature regimes, comprise of variable range hopping, grain boundary effect and activated thermal conduction. Most interestingly, the thin films manifest a high thermoelectric power factor and absorption in the UV region, indicating their potential in thermoelectric and UV energy conversion device fabrication, respectively.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
