Abstract

Extremely sharp, uniform, low operation voltage and high integrated field emitter arrays (FEAs) have been developed by the transfer metal mold emitter fabrication technique using ultra precision machining and super microelectroplating technology to realize highly efficient and reliable vacuum microelectronic devices, especially, vacuum microelectronic power switching devices. Transfer Ni FEAs using Cu Master FEAs and Transfer Ni FEA using Ni Master FEA, having high emitter density of 8 million tips/cm/sup 2/, containing 1.31 billion emitter tips, one of the highest values reported in the world to date, have demonstrated the lowest turn-on voltage value of 9.5 V//spl mu/m, 14.9 V//spl mu/m, respectively. Because of the superior transfer characteristics and the cutting precision by microelectroplating and ultra precision machining, the emitter tip radii of Cu Master FEAs, Ni Master FEAs, and their Transfer Metal Mold Ni FEAs, are as small as 10 nm.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.