Abstract
We report on the direct measurement of low-light-level cross-phase modulation (XPM) based on electromagnetically induced transparency (EIT) in the pulsed regime. A phase shift of 0.02 rad of a probe pulse modulated by a signal pulse with a peak intensity of 3 $\mathrm{\ensuremath{\mu}}\mathrm{W}/{\mathrm{cm}}^{2}$ was observed, which is the lowest intensity ever achieved for the N-type EIT-based XPM system. The experimental data make a quantitative prediction of the single-photon-level XPM phase shift arising from two interacting pulses with unequal group velocities that is consistent with the theoretical predictions proposed by Harris and Hau [Phys. Rev. Lett. 82, 4611 (1999)]. Furthermore, a proof-of-principle experiment demonstrating an enhancement of the nonlinear optical Kerr effect by shining the signal pulse twice is presented.
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