Abstract
A detailed investigation of the low frequency noise in rectifier diodes in the breakdown regime showed that the noise is a nonmonotonic function of the reverse current. A dynamic “competition” between impact ionization and microplasma switching explains the nonmonotonic, repetitive, and correlated variations in the breakdown slope (change in voltage per unit change in current—dV/dI), the noise level, and the noise waveform. These variations are due to the bistable microplasma fluctuation. The theories for avalanche charge multiplication and microplasma fluctuation should be combined with the microplasma switching theory to develop a physical model for the avalanche breakdown.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
