Abstract
The low-frequency spectra of the combination light scattering (CLS) (Raman scattering) for thermally deposited selenium films, as well as pure and samarium doped chalcogenide vitreous semiconductor (CVS) Se95Te5, are studied. It is shown that in the spectral region of ν < 100 cm −1 a clearly pronounced broad boson peak is revealed, whose characteristics depend on the chemical composition and doping. The observed features are accounted for by a change in the degree of disorder in the material at a level of a medium-range order and its dimensions are estimated.
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