Abstract
In this paper, we present a new multi-tone test signal generation method with different frequency tones uniformly distributed across a wideband spectrum. It employs OFDM (orthogonal frequency-division multiplexing) spread spectrum technique to allow users to define signal parameters with a great flexibility as per the test requirements. This OFDM method essentially starts from the frequency sampling and then conversion to generate time domain signals, which can significantly reduce the number of data points in the signal generation. Response of such test signals from the device under test (DUT) can be captured and analyzed so as to characterize frequency response associated with each frequency tone. For validation, simulations with Matlab Simulink tool and hardware implementation on a Xilinx Virtex5 FPGA board are developed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
