Abstract
Infrared optical systems are, fundamentally, very sensitive devices which use rather extraordi optical electronics systems to process optical signals. Unfortunately, this very sensitivity may be excite by high power continuous wave visible - UV lasers and low average powered repetitive visible - UV pulsed lasers. Fundamentally, the lasers interact with the optical thin film dielectric coatings causing them to shift the working wavelength band and, thereby, taking away the optical signal from the sensor. In this paper are described analytical expressions for evaluating the temperature transient in the optical thin films and the subsequent diminution of the Modulation Transfer Function (MTF) of the optical system. Additionally, expressions are provided for evaluating reflective metal surfaces destruction through slip failure which will diminish the Strehl ratio of the system and subsequent loss of MTF.
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