Abstract
The Cathode Strip Chamber (CSC) is the primary system for muon detection in the CMS endcap region. Starting in 2026 both the instantaneous luminosity and CMS level 1 latency will be increased significantly, which will exceed the design specifications of the CSC electronics. The large integrated particle flux also increases the potential for chamber aging and performance degradation. This paper presents the studies of CSC electronics and CSC longevity performed at the CERN GIF++ facility.
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