Abstract
Long-term degradation tests regarding white light-emitting diodes based on InGaN were performed under accelerated current conditions, and the half-life of the light's output was estimated. An estimated mean half-life of 1.5×10 4 h was obtained under the recommended 20-mA operating condition. The change in the emission spectrum was found to be slight, and the color quality was considered generally satisfactory over the long term.
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