Abstract

We investigated the fabrication of neodymium doped thin film optical waveguide-based devices as potential active sources for planar integrated optics. Liquid-phase epitaxial growth was used to fabricate neodymium-doped yttrium aluminum borate films on compatible lattice-matched, un-doped yttrium aluminum borate substrates. We observed the refractive index contrast of the doped and un-doped crystal layers via differential interference contrast microscopy. In addition, characterization by X-ray powder diffraction, optical absorption and luminescence spectra demonstrated the crystal quality, uniformity and optical guiding of the resulting thin films.

Highlights

  • Integrated optics and photonics are increasingly important for optical signal processing in many applications

  • We investigated liquid phase epitaxy as an effective growth method for Nd:YAl3 (BO3 )4 (Nd:YAB)

  • Results of Crystal Growth grown for two weeks under similar conditions as the thin films, with the temperature ramping down grown for two weeks under similar conditions as the thin films, with the temperature ramping down by 0.5 ◦ C per day

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Summary

Introduction

Integrated optics and photonics are increasingly important for optical signal processing in many applications. The refractive index inside a dielectric material may be modified using nonlinear multiphoton processes [4,5], or ion-exchange [6] In another approach, two crystals may be optically polished and thermally bonded to achieve strong adhesion between the crystal layers [7]. Following an early report of epitaxial film growth [32], there has been recent interest in developing borate crystals for waveguide devices that are compatible with integrated optics. This geometry enables the concentration of the light in the active layer to enhance both the amplification and the optical nonlinearity of the device [33,34,35,36]. Differential interference contrast microscopy, X-ray powder diffraction and optical absorption and luminescence spectra were used to characterize the optical quality and uniformity of these thin films

Crystal Growth Methods
Results of Crystal Growth
Crystal Characterization Results
Discussion

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