Abstract
The overall workplan for assuring the reliability of GaAs MESFETS is presented, as a result of 10 years of industrial experience. The importance of an accurate evaluation of failure mechanisms and acceleration fac-tors is pointed out, describing problems and criticalities related to the reliability testing and the failure analy-sis of this kind of devices. Finally, field data coming from our dynamic data base for system monitoring and surveillance are presented and discussed, demonstrating the satisfactory level of field reliability achieved during last years.
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