Abstract
Soft magnetism in FeN-based films intimately depends on the lattice dilation caused by N incorporation. We suggest that the softest magnetic properties can be predicted in terms of critical lattice dilation. A detailed investigation of the structure constant in FeTaN films is presented and theoretically described. A comparison is made between Takahashi and Shimatsu's model as a function of the lattice dilation and Doyle and Finnegan's model with respect to the film stress. Finally, predictions are made for the behavior of FeSiN and FeAlN films.
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