Abstract
Lateral displacements of well-focused beams reflected from absorbing media are demonstrated in this paper. The incident beam is modeled as a tapered wave with a Gaussian spectrum. The field solutions are obtained on both sides of the interface by solving analytically from Maxwell's equations and by matching the boundary conditions at the interface. Numerical simulations are presented and the field values as well as the time-averaged power densities are computed. The influences of the polarization, the angle of incidence and the beam width on the displacement are discussed. The origin of the displacement lies in the absorption of the media, for which there is a phase shift between the incident and reflected waves. Because of this phase shift, the center of the reflected beam does not coincide with that of the incident one, similar to the Goos–Hänchen shift.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Optik - International Journal for Light and Electron Optics
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
