Abstract
We investigated the optical polarization anisotropy of m-plane GaInN/GaN quantum well structures on m-plane SiC and bulk GaN substrates. On bulk GaN, the degree of polarization increases with increasing indium content according to the larger strain-induced separation of the topmost valence bands. On m-plane SiC, however, we observe constantly large polarization ratios of around 90% and more. From an x-ray strain state analysis and calculations of the valence band energies, we find that an anisotropic strain of the GaN buffer layer leads to a very strong separation of the topmost valence bands resulting in a large degree of polarization.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
