Abstract
In this work we successfully applied a FIB/lift-out technique to prepare site-specific thin samples containing the cathode/electrolyte interface between two La0.4Sr0.6Co0.8Fe0.2O3-δ (LSCF) / Ce0.9Gd0.1O2-δ (CGO) half cells. Despite different cathode thickness (15 μm and a 5 μm), both samples presented similar composition and nanostructure. However, an exhaustive microscopic analysis by SEM and TEM at high resolution modes, revealed that: the 15 μm sample presented a perfectly attached interface, while the other showed pores at the interfacial boundary, decreasing the real LSCF/CGO contact. In this way we could explain part of the difference in area specific resistance between measured between them.
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