Abstract
K-shell fluorescence yields of low, medium Z and rare earth elements were determined using Si(PIN) detector and HPGe detector employing reflection geometry set up. Target atoms were excited using 59.5 keV gamma rays emerging from Am-241 source of strength 300 mCi. Background radiation and multiple scattering effects were minimized by properly shielding the detector. The elemental foils of uniform thickness and 99.9% purity were used in the present investigation. The fluorescent spectra were recorded in an 8K and 16K multi channel analyzer. The data were carefully analyzed and total K-shell fluorescence yields were calculated. The resulting yield values are compared with the available experimental and theoretical values.
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More From: International Journal of Chemoinformatics and Chemical Engineering
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