Abstract
Vacancy-gas defects (VGDs) in thin layers of silicon carbide and a metal (SiC/Me) are formed upon 1–10-keV Xe++ ion implantation as the result of a first-order phase transition. The nonequilibrium stage of this transition is modeled by stochastic processes of point-defect clustering and the Brownian motion of cluster centers of mass under the action of potentials of their indirect elastic interaction in the crystal lattices of materials. A numerical experiment for studying pore formation during ion implantation is constructed on the basis of kinetic theory. Stochastic molecular dynamics makes it possible to analyze the formation of pores depending on functions of the nonequilibrium distribution of VGD nucleus clusters over sizes and coordinates of the layer volume. An example of calculation for conditions of phase-transition fluctuation instability is given.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
More From: Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.