Abstract
An excess resistivity above the usual topological relaxation contribution is seen in Cu50Zr50 glassy alloy upon annealing at temperatures far below the glass transition. This excess resistivity is correlated with the appearance of a well defined two step crystallization when the annealed sample is heated through Tc at a rate of 15 C/min. X-ray diffraction suggests that phase separation is taking place and is responsible for this anomalous resistivity behavior. Results from transmission electron microscopy are consistent with this interpretation.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
