Abstract
Kinematic simulations are used to investigate the geometrical properties of convergent beam low-energy electron diffraction patterns from an Si(0 0 1) surface. Compression of a low-energy electron microscope immersion lens is included explicitly and the sensitivity of patterns to surface reconstruction and dimer buckling is investigated. Key pattern features and whole pattern symmetries are identified from the simulations and interpreted geometrically. Advantages over conventional low-energy electron diffraction techniques are identified.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
