ISA Based Functional Test Generation with Application to Self-Test of RISC Processors

V.V Belkin,S.G Sharshunov

doi:10.1109/ddecs.2006.1649575

ISA Based Functional Test Generation with Application to Self-Test of RISC Processors

V.V Belkin, S.G Sharshunov

https://doi.org/10.1109/ddecs.2006.1649575

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Publication Date: Apr 18, 2006

Citations: 11

#Method For Functional Test Generation #RISC Processor Core + Show 8 more

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Abstract

This paper presents a method for functional test generation, which aims self-test of RISC processors and processor cores. The method allows developing compact and quite effective software based tests if only the instruction set architecture (ISA) or ISA together with some micro architecture features are known. We have successfully applied this methodology to test a RISC processor core

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