Abstract
Thin Films of different thickness of Cadmium Selenide (CdSe) were prepared by using thermal evaporation technique on a glass substrate, and investigation of dielectric properties as a function of frequency in the range up to 1 MHZ using Auto Lab Potentiostat/Galvanostat meter was conducted. Preliminary data for complex parameters i.e. complex dielectric constant (ε*), complex impedance (Z*), electric modulus (M*), tangent loss (δ) and conductivity (σ) has been calculated. All these properties are used to explore various processes that contribute to the dielectric spectroscopy investigation.
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