Abstract
The results of studying the effect of defocusing on interference patterns obtained in X-ray three-block interferometers are presented. Three-block defocused interferometers without a thick block analyzer, with a thick block analyzer and with a separate thick block (enlarger) are designed, manufactured and tested. It is shown that fine structures of interference patterns obtained from three-block defocused interferometers are observed in cases when the interferometer analyzer block is thick or an enlarger is used (fourth thick block). Theoretical calculations show that in the presence of defocusing, as a result of superposition of beams on the input surface of the interferometer analyzer, an interference pattern is formed in the form of parallel fringes (lines) lying in the scattering plane. The coordinates of the maxima of the interference fringes (lines) and the period of the fringes are calculated in the cases without a thick crystal and in its presence, as well as the magnification factor. It has been experimentally proved that a thick crystal (enlarger crystal) does not introduce new information into the interference pattern, but only increases its size in the scattering plane.
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