Abstract
In this paper, we investigate the dielectric response of binary disordered systems, which are widely modelled by random resistor–capacitor networks (RRCN). Our results show the existence of a scaling law connecting the standard deviation of conductivity to the network size and capacitors proportion. In addition, we have studied the effect of using lossy capacitors on the dielectric response of RRCN. We found that lossy capacitors may introduce substantial effects of the dielectric loss, especially at low frequencies.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
