Abstract
The heat dissipation mechanisms are play an important role in semiconductor devices. Due to overheating of the component (MOSFET) in constant current mode DC electronic load which is used for test and simulate the current-voltage characteristics of batteries in power laboratory at Open University of Sri Lanka leads to circuit malfunction. In this paper analyzed and experimentally proved the suitable heat dissipation method for DC electronic load circuit for laboratory purpose at low cost. The optical method, physical contact method, and electrical method are used to measure the temperature of the semiconductor devices. Physical contact method is suitable for measure the case temperature of the MOSFET. Once measured the case temperature, by using a proper heat dissipation method keep the MOSFET in the safe thermal margin. Heat sink with cooling fan is the most optimal solution for the DC electronic load circuit at low cost.
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